Field Emission and Photoluminescence Properties of Al-Doped T-ZnO Whiskers
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摘要: 用丝网印刷法将Al掺杂的T-ZnO晶须制备成薄膜,以研究其结构形貌、光致发光及场发射性能.所有发光谱均由强的紫外光发射(发光中心集中在373~383 nm)和宽的黄绿光发射(发光中心集中在510~540 nm)组成.ZnO薄膜的内部缺陷浓度决定黄绿光发射的强度.掺杂0.5 mol/L的Al样品的紫外光强度最大,场发射性能最好,其开启电场和阈值电场分别达到0.74 V/μm和2.6 V/μm,场增强因子值为30249.Abstract: Al-doped tetrapod-like ZnO(T-ZnO) films were fabricated using screen printing method to study their structures,surface morphologies,optical properties and field emission behaviors.All samples show typical photo luminescence(PL) behaviors with two emissions of a narrow UV peak centering around 373 to 383 nm and a green deep level peak centering around 510 to 540 nm.The green deep level PL emission is attributed to the defects in the T-ZnO films.The largest UV peak and the highest field emission were observed on 0.5 mol/L Al-doped T-ZnO films.The turn-on field and the threshold field of the T-ZnO films were 3.6 V/μm and 6.9 V/μm,respectively,and the enhance field factor was 30 249.
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Key words:
- T-ZnO /
- whisker /
- field emission property /
- ultraviolet emission /
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