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典型缺陷对高压储能电容器电场分布的影响

张血琴 吴广宁 李晓华 边姗姗

张血琴, 吴广宁, 李晓华, 边姗姗. 典型缺陷对高压储能电容器电场分布的影响[J]. 西南交通大学学报, 2008, 21(1): 14-18.
引用本文: 张血琴, 吴广宁, 李晓华, 边姗姗. 典型缺陷对高压储能电容器电场分布的影响[J]. 西南交通大学学报, 2008, 21(1): 14-18.
ZHANG Xueqin, WU Guangning, LI Xiaohua, BIAN Shanshan. Effects of Typical Defects on Electrical Fields in High-Voltage (Storage) Capacitors[J]. Journal of Southwest Jiaotong University, 2008, 21(1): 14-18.
Citation: ZHANG Xueqin, WU Guangning, LI Xiaohua, BIAN Shanshan. Effects of Typical Defects on Electrical Fields in High-Voltage (Storage) Capacitors[J]. Journal of Southwest Jiaotong University, 2008, 21(1): 14-18.

典型缺陷对高压储能电容器电场分布的影响

基金项目: 

国家自然科学基金委员会与中国工程物理研究院联合资助基金项目(10476022)

详细信息
    作者简介:

    张血琴(1979- ),女,博士研究生,研究方向为电气设备的局部放电检测技术,E-mail:zxq_5586@tom.com

    通讯作者:

    吴广宁(1969- ),男,教授,博士,主要研究方向为电气设备状态监测与故障诊断,E-mail:gnwu@home.swjtu.edu.cn

Effects of Typical Defects on Electrical Fields in High-Voltage (Storage) Capacitors

  • 摘要: 根据电容器的绝缘和工作特点,建立了内部、接触、重叠和油质4种典型缺陷模型,并用有限元方法分析二维平面轴对称电场.结果表明,内部缺陷处的电场强度可能超过介质额定工作场强,而且空间电荷密度越大,大脉冲放电负峰电压下的电场分布畸变越严重;接触缺陷的毛刺和氧化点均造成电场集中;重叠缺陷处的电场超过介质额定工作场强;油质缺陷处的电场强度小,也基本不受空间电荷的影响.

     

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出版历程
  • 收稿日期:  2006-10-24
  • 刊出日期:  2008-02-25

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