|
LAURENT C,MAYOUX C.Partial discharge-part XI:Limitation to PD as a diagnostic for deterioration and remaining life[J]. IEEE Electrical Insulation Magazine,1998,8(2):14-16.[2] 张血琴,郭俊,吴广宁,等.采用直流局部放电的方法评估高压储能电容器性能的试验研究[C] //2003全国高校电力系统及其自动化专业第19届学术年会论文集.成都:西南交通大学出版社,2003:1 488-1 490.[3] HOOGENRAAD G,BEYER J.Digital HVDC partial discharge testing[C] // Conerence Record of the 2000 IEEE International Symposium on Electrical Insulation.Anaheim:IEEE Press,2000:448-451.[4] ILDSTAD E,HAAVE T.Conduction and partial discharge activity in HVDC cable insulation of lapped polypropylene films[C] //2001 IEEE 7th International Conference on Solid Dielectrics.Eindhoven:IEEE Press,2001:137-140.[5] ZHANG Xueqin,WU Guangning.Quality evaluation of high voltage storage capacitor through DC partial discharge measurement[C] //8th IEEE International Conference on Solid Dielectrics (ICSD2004).Toulouse:IEEE Press,2004,2:755-758.[6] 于钦学,印昌容,谢恒堃.油纸绝缘直流局部放电的研究[J]. 变压器,1998,35(5):17-20.YU Qinxue,YEN Changrong,XIE Hengkun.Study on partial discharge in oil-immersed insulation under DC voltage[J]. Transformer,1998,35(5):17-20.[7] 陈勇,于成龙,何承基.直流局部放电测试技术在电容器老化判断中的应用[J]. 中国测试技术,2003(5):20-21.CHEN Yong,YU Chenglong,HE Chengji.Application of DC PD technique in judgement of capacitor aging[J]. China Measurement Technology,2003 (5):20-21.[8] 张血琴,吴广宁,于成龙,等.高压储能电容器局部放电信号的提取与分析[C] //第九届全国工程电介质学术会议论文集.西安:西安交通大学出版社,2003:173-176.[9] 林福昌,徐智安,代新,等.高储能密度脉冲电容器的研究[J]. 高电压技术,2002,28(7):34-37.LIN Fuchang,XU Zhian,DAI Xin,et al.Evolution of high energy density pulse capacitors[J]. High Voltage Engineering,2002,28(7):34-37.[10] 代新,林福昌,李劲,等.金属化聚丙烯膜脉冲电容器端部接触老化研究[J]. 中国电机工程学报,2001,21(8):51-54.DAI Xin,LIN Fuchang,LI Jin,et al.Electrode-end contact degradation of metallized polypropylene pulse capacitors[J]. Proceedings of the CSEE,2001,21(8):51-54.[11] FROMM U.Interpretation of partial discharges at DC voltages[J]. IEEE Transaction on Dielectrics and Electrical Insulation,1995,2(5):761-770.[12] FROMM U,MORSHUIS P H F.Partial discharge classification at DC voltages[C] //1995 IEEE International Conference on Conduction and Breakdown of Solid Dielectrics.Leicester:IEEE Press,1995:403-407.
|
点击查看大图
下载: