• ISSN 0258-2724
  • CN 51-1277/U
  • EI Compendex
  • Scopus
  • Indexed by Core Journals of China, Chinese S&T Journal Citation Reports
  • Chinese S&T Journal Citation Reports
  • Chinese Science Citation Database
Volume 16 Issue 5
Oct.  2003
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Article Contents
YANG Guang, QIUJing, WENXi-sen, LIU Guan-jun. Mathematical Model Analysis of False Alarm inMechatronics Built-in Test Systems[J]. Journal of Southwest Jiaotong University, 2003, 16(5): 581-583.
Citation: YANG Guang, QIUJing, WENXi-sen, LIU Guan-jun. Mathematical Model Analysis of False Alarm in Mechatronics Built-in Test Systems[J]. Journal of Southwest Jiaotong University, 2003, 16(5): 581-583.

Mathematical Model Analysis of False Alarm in Mechatronics Built-in Test Systems

  • Publish Date: 25 Oct 2003
  • Based on the mechanism of the false alarm and built-in test (BIT) system information treating process, a model was established for calculating false alarm rate (FAR). Based on the Bayes probability, an analysis model for FAR in general BIT systems was established. For decreasing FAR, an improved model for BIT systems with embedded abnormal data detecting and renewing functions was proposed, and the effectiveness of the proposed model was proved. The factors affecting FAR were analyzed systematically, revealing that the main characteristic parameters include the FAR on diagnosis layer and the missed alarm rate and fault rate on sensor layer.

     

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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